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About random and systematic yield loss

Dear All

Currently I read about systematic yield and random yield effect on
the
overall yield of wafer.
I have no idea how people actually group the systematic yield and
random yield separately.


Do people get the overall yield from probing and then run
statistically tool and analysis to get the
systematic and random yield by some advanced curve fitting
techniques?


OR some matrix of different conditions need to be run in order to
find
the systematic part of the sensitivity in yield loss?


I believe the first one should be more advisable.


Kindly enlighten.
Thank you for your help in advance.


best regards
Jason
 
J

JosephKK

[email protected] [email protected] posted to
sci.electronics.design:
Dear All

Currently I read about systematic yield and random yield effect on
the
overall yield of wafer.
I have no idea how people actually group the systematic yield and
random yield separately.


Do people get the overall yield from probing and then run
statistically tool and analysis to get the
systematic and random yield by some advanced curve fitting
techniques?


OR some matrix of different conditions need to be run in order to
find
the systematic part of the sensitivity in yield loss?


I believe the first one should be more advisable.


Kindly enlighten.
Thank you for your help in advance.


best regards
Jason

You need to understand the terms in regard to general manufacturing
first. Then the specific application to IC's and wafers follows
with minimal effort.
 
J

JosephKK

[email protected] [email protected] posted to
sci.electronics.design:
Dear Joseph

Thanks a lot

Any links you could share for understanding the general term and
calculation of each term?

Thank you
Jason

While i generally don't do your googling for you, i will test for
some useful search strings and show some hopefully useful links:

search strings:

random yield losses
systematic yield losses
yield loss modeling

links:
holomirage.com/Articles/TI_CAL.doc
http://www.edn.com/index.asp?layout=article&articleid=CA500806&partner=enews&text=synopsys
http://www.siliconfareast.com/test-yield-models.htm
 
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