R
Roger bourne
Good day to all,
Does anyone know of any peculiarities concerning the measurement of the
standby current of a DDR RAM?
I was thinking of measuring the standby current like I do for a regular
IC module; setting all data inputs to ground/vdd and placing a small
resistor in the path to ground. In this manner, the resistor's voltage
drop can be used to extrapolate the standby current. Perphaps,
amplifying the resistor's voltage drop can increase the measurement
accuracy...
Given that I know relatively little about DDRs (I will research them
after I post this post), I was wondering if this typical standby
current measurement setup will be apllicable for DDRs. After all, DDRs
operate in standby with clocks in the 100's of MHz and standby currents
in the order of 10's of mA.
After my measuring standby current issues have been resolved, I will
also have to perform other typical tests one would normally perform on
an IC module by ATE. Being new at ATE (the test setup is oriented as
ATE), I would welcome any advice, links, ect...
As of now, I am aware of the open/short tests, R/W verification of the
memory addresses and the standby current.
The DDR (to be tested) in question is unknown for the moment.
Regards,
Roger
Does anyone know of any peculiarities concerning the measurement of the
standby current of a DDR RAM?
I was thinking of measuring the standby current like I do for a regular
IC module; setting all data inputs to ground/vdd and placing a small
resistor in the path to ground. In this manner, the resistor's voltage
drop can be used to extrapolate the standby current. Perphaps,
amplifying the resistor's voltage drop can increase the measurement
accuracy...
Given that I know relatively little about DDRs (I will research them
after I post this post), I was wondering if this typical standby
current measurement setup will be apllicable for DDRs. After all, DDRs
operate in standby with clocks in the 100's of MHz and standby currents
in the order of 10's of mA.
After my measuring standby current issues have been resolved, I will
also have to perform other typical tests one would normally perform on
an IC module by ATE. Being new at ATE (the test setup is oriented as
ATE), I would welcome any advice, links, ect...
As of now, I am aware of the open/short tests, R/W verification of the
memory addresses and the standby current.
The DDR (to be tested) in question is unknown for the moment.
Regards,
Roger
