Hi steve! Thanks for the info, do you have background about semiconductor test? I am studying how functional test works, (simple continuity test/diode test). See this link's page 29 https://www.soft-test.com/wp-content/uploads/2013/04/FunctionalTest.pdf , I understand what this link explains, but it doesn't explain how the programmable load operates. I tried to check it in google, I can't find any reference.
With ALL of that info that he gave, the definitive info that you actually want is not even being there.
All of that info that you reference to is aligned to implementation of testing circuitry utilizing an electronic load.
The closest that you even approach to the actual load principle is on page 8-38 and that is totally devoid of the control circuitry levels into the variable pulse width driven power FET pair used as the absorptive load.